PHE101 Discrete Wavelength Ellipsometer

Angstrom Advanced Inc
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Discrete Wavelength Ellipsometer

Angstrom Advanced sets the standard in Ellipsometry-bringing the best in ellipsometry technology at the most affordable prices.Angstrom Advanced offers full range of ellipsometers for thin film thickness measurements, optical characterization for refractive index and extinction coefficient analysis (n & k). Angstrom Advanced Inc ellipsometry can be used for many different applications and are used in some of the most prestigious laboratories such as MIT, NASA, UC Berkeley, Yale University, Duke University, NIST and many more.

The PHE101 is the latest discrete wavelength ellipsometer with many new features, such as material library, wide variable angle, a second laser for alignment and a powerful software making the PHE101 Ellipsometer with high accuracy and repetition.

PHE101 Discrete Wavelength Ellipsometer

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