NEW: Tabletop Electron Microscope by Hitachi High-Technologies Europe

It is the useful tool for sample surface observation and screening analysis.

*Typical Configuration of TM3030 with Quantax70*Built-in EDX detector

(Manufactured for Hitachi High-Technologies corporation by Bruker Nano GmbH)

Features

Light Element detection from Boron upwards.

Linescan,Mapping and multiple Point Analysis available.

No LN2 required. Quick and Easy Analysis obtained within minutes.

Image and elemental data displayed on the same monitor.

More information

Details

Via Savona, Milano MI, Italy

Hitachi High-Technologies Europe

Associated Trend items

NEW: magnetic field tester by Hitachi High-Technologies Europe

The BM3100 Series Head Tester is a powerful equipment that measures the width of the magnetic field of a magnetic recording head. Using a magnetic force microscope (MFM), it can measure the magnetic field width with high-resolution and performs the measurement in a non-destructive (non-contact) method under high-speed conveyance positioning and high speed. The high-speed, fully-automated equipment can support mass production.

Features Using a row bar process, the equipment measures the magnetic field with of the Write component High-resolution magnetic field measurement through MFM method High throughput that can support mass production

More information

NEW: scanning electron microscope with focused ion probe by Hitachi High-Technologies Europe

Toward the ultimate TEM sample preparation system

FIB-SEM systems have become an indispensable tool for characterization and analysis of the latest technologies and high performance nano-scale materials. An ever-increasing demand for ultrathin TEM lamellas without artifacts during FIB processing require the best in ion and electron optics technologies. Hitachi's NX2000 high performance FIB and high resolution SEM syst...

More information

NEW: 3-axis milling system by Hitachi High-Technologies Europe

Second-generation IM4000 series ion-milling systems with improved milling speed.

The IM4000Plus Series Ion-Milling Systems are the second-generation of IM4000 series hybrid instruments that support Cross-Section Milling and Flatmilling®. A wide variety of system configurations are available: Standard, Cooling, Air Protection, and Cooling & Air Protection. Features Faster milling with improved ion optics (> 500 μm/h at 6 kV) Intermittent milling ...

More information

Products associated

EDX spectrometer

Quantax75

Compare

Remove all

Compare up to 10 products