EDXRF Operates With No Sample Prep

JEOL’s JSX-1000S ElementEye is an easy-to-use, smart solution for high-sensitivity elemental analysis in a benchtop EDXRF spectrometer

It analyzes major to trace components on most sample types—solids, powders and liquids—with little or no sample preparation. The benchtop solution complements SEM, EPMA, NMR and mass spectrometry analyses, providing high-sensitivity qualitative and quantitative analysis results in minutes. A thin-film FP method is optionally available for non-destructive measurement of film thickness on coated samples. High-sensitivity analysis can be performed across the entire energy range using a maximum of nine types of filters and a sample chamber vacuum unit. Additional features include an optional 12-position auto sample changer; touchscreen operation; pre-recorded recipes for standard solution applications, high-sensitivity SDD and short-path optical system for high throughput analysis.