Nanopositioning Stage & Digital Controller for Imaging, Surface Metrology and Microscopy Available from PI

Piezo Nanopositioning Systems specialist PI (Physik Instrumente) LP – has introduced a new piezo-Z nanopositioning system for imaging and fast focusing applications

It consists of large aperture piezo stage and a digital controller.

PI’s new P-736.ZR Large Aperture flexure-guided piezo nanopositioning stages are optimized for high resolution and very fast step and settle, such as required for real time imaging applications.

Large Aperture Nanopositioning Stage

The very low profile allows for easy integration, the large aperture, and travel ranges of up to 220 µm with sub-nanometer closed-loop resolution are prerequisites for surface metrology, microscopy and imaging applications.

Fast Focusing / Tracking

PI’s digital nanopositioning controllers can be quickly switched between focus tracking and closed-loop positioning, and also accommodate fast focus and freeze applications.

Integration into Standard Microscopes

The nanopositioning stages can also be mounted on inverted microscopes from Nikon and Olympus. The large aperture easily accommodates accessories such as well plates and incubation chambers.

Included in the delivery is a compact digital servo piezo controller of the latest generation. A variety of fast user interfaces such as USB, SPI, RS-232 and even real time analog provide programmers with the flexibility they need in their integration process. The extensive, well-documented, interface-independent software support includes Windows .dll, Linux .so, and LabVIEW .llbs.

System Features:

Large aperture for transmitted light, well plates etc,

Low profile for easy integration

Fast step & settle (few milliseconds)

Large Travel range of 220 µm

Outstanding lifetime due to PICMA® piezo ceramic stacks

Piezoresistive sensors for lower cost

Capacitive sensors for higher stability

Digital controller with input for autofocus signals and fast focus and freeze