#Product Trends
Angstrom released new technology of the X-ray Diffraction equipment
Features
Computed tomography, High-resolution X-ray diffraction, High throughput screening, In-plane diffraction, Crystallite size and micro-strain analysis, Micro-diffraction, Non-ambient diffraction, Pair distribution function analysis, Phase identification, Phase quantification, Reflectivity analysis, Residual stress analysis,
Crystallography, Texture analysis, Transmission, Thin film analysis.
ADX-DWZ Combination of Eulerian cradle for stress and texture investigations, Thin film and Quantity Analysis attachment with control and analysis software with alignment-free feature.
ADCX sample changer is compact and rugged. Integrated spinning improves particle statistics in polycrystalline sample measurements. Fully automatic alignment. Programmable
