X-ray Diffraction (XRD)
ADX-2500 X-ray Diffraction (XRD) is designed for application in the microstructure measurement, testing and in-depth research investigations. With different accessories and the corresponding control and calculating software, ADX-2500 XRD is a diffraction system according to the practical requirements in many fields.
ADX-2500 X-ray Diffractometer provides the structure analysis of single crystal, polycrystalline and amorphous sample. ADX-2500 X Ray Diffraction is capable of the following: phase qualitative analysis and quantitative analysis (RIR, Internal standard calibration, External standard calibration, Additive criterion), pattern indexing, unit cell determination and refinement, crystallite size and strain determination, profile fitting and structure refinement, residual stress determination, texture analysis(ODF expresses three-dimensional pole figure), crystallinity estimate from peak areas, thin film analysis and others.