Free Webinar About Failure Analysis, Customer Complaints and Troubleshooting

µ-FTIR in Failure Analysis & Troubleshooting - LUMOS II Hands-on and Live Q&A

Bruker invites you to join our application specialist Eric Klein in his demo lab, as he analyzes and explains two typical samples from defect and failure analysis. The first sample is a typical customer complaint which was returned due to an unknown contaminant on the products surface. The second sample is a standard particle trap, which was used to understand contamination routes and prevent the reoccurence of particle contaminations. Register now!

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Rudolf-Plank-Straße, 76275 Ettlingen, Germany

Bruker Optik GmbH

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FTIR microscope

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