The CHOTEST VJ series 3D contour measuring instrument allows for easy acquisition of 2D/3D parameters with just one click.

The CHOTEST VJ series 3D contour measuring instrument is a non-contact scanning 3D contour imaging device used in fields such as semiconductors, 3C electronics, medical devices, magnetic materials, and precision machinery.

The workpiece does not require positioning; it is automatically recognized, and a quick flash measurement is taken to easily obtain 2D/3D parameters. It features a line laser probe that can suppress the influence of multiple reflections and diffuse reflections on the sample surface, achieving ultra-high precision measurements.

The VJ series 3D contour measuring instrument scans the surface of electronic circuit samples, revealing the groove contours clearly, as shown in the image above. By extracting a cross-sectional profile curve from the image, the groove’s contour curve can be clearly seen. At this point, the contour analysis function is used to annotate the height and other dimensional data of the feature area. A rich set of 2D measurement tools allows for various measurements of height, width, angle, and R angles through the cross-sectional shape.