CIQTEK FIB-SEM Practical Demonstration - TEM Sample Preparation

TEM Sample Preparation

In order to demonstrate the outstanding performance of DB500 to users, the Electron Microscopy team has specially planned the special program " CIQTEK FIB Show", which will present the wide range of applications in the fields of materials science, semiconductor industry, biomedicine, etc. in the form of video.

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Hefei, Anhui, China

CIQTEK Co., Ltd.

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focused ion beam scanning electron microscope

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