Application Cases | Application of Field Emission SEM in Electrolytic Copper Foil

Application of Field Emission SEM in Electrolytic Copper Foil

In materials science, the composition and microstructure determine the mechanical properties. Scanning Electron Microscope (SEM) is a commonly used scientific instrument for the surface characterization of materials, allowing observation of the surface morphology of copper foil and the distribution of grains.

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Electrolytic Copper Foil Cross-Section ECCI Image

The figure below shows the characterization of electrolytic copper foil using the CIQTEK Field-emission SEM5000

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Hefei, Anhui, China

CIQTEK Co., Ltd.

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field emission scanning electron microscope

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