CIQTEK FIB SEM Practical Demonstration- Nano Micropillar Specimen Preparation

SEM (Scanning Electron Microscope) and TEM (Transmission Electron Microscope) are two common forms of electron microscopes. SEM uses Secondary Electrons (SE) and Back-scattered Electrons (BSE) to capture images of the specimen surface, while TEM detects transmitted electrons to generate projection images through the specimen's interior.

1. Does the magnetic nature of a specimen affect SEM testing? 2. What are the effects of radioactive specimens on SEM testing? 3. Is specimen stability important for SEM testing? 4. Why can't Energy Dispersive Spectrometer (EDS) in SEM provide accurate quantification? 5. What is a back-scattered electron image? 6. What is the relationship between the scale bar in electro...

In the spirit of the upcoming Christmas season, our esteemed overseas customers have recently been pleasantly surprised by a generous “gift” from CIQTEK. We are delighted to announce that our valued customers in Saudi Arabia and South Korea have received Scanning Electron Microscopes (SEM) as their "Christmas presents." As the Christmas season approaches, we extend our ...