CIQTEK Continues Shipping Success: Delivering High-End Electron Microscopes to Over 40 Countries Worldwide

SEM (Scanning Electron Microscope) and TEM (Transmission Electron Microscope) are two common forms of electron microscopes. SEM uses Secondary Electrons (SE) and Back-scattered Electrons (BSE) to capture images of the specimen surface, while TEM detects transmitted electrons to generate projection images through the specimen's interior.

1. Does the magnetic nature of a specimen affect SEM testing? 2. What are the effects of radioactive specimens on SEM testing? 3. Is specimen stability important for SEM testing? 4. Why can't Energy Dispersive Spectrometer (EDS) in SEM provide accurate quantification? 5. What is a back-scattered electron image? 6. What is the relationship between the scale bar in electro...

CIQTEK, recently welcomed esteemed customers, Dan from the United Kingdom and Philippe from France, who visited the company to explore its cutting-edge Scanning Electron Microscope (SEM). Both customers were highly impressed with CIQTEK's SEM technology, which combines superior engineering, design features, and user-friendly functionalities.