#White Papers
Revolutionizing Burn-In Testing
Cosmic’s Ovenless, Energy-Efficient Solution
In the semiconductor ecosystem, the semiconductor Burn-In process is one of the most delicate and sensitive procedures as it helps prevent inherent defects, commonly recognized in electronics and described by the so-called bathtub curve. This curve illustrates the defect rate throughout the product lifecycle of a component. Given the natural occurrence of infant mortality failure of components, the Burn-In test procedure aims to identify those components that exhibit early failure and must therefore be intercepted and discarded. If these defective components are released into the market, they could cause severe malfunctions and potentially harm people or property.
