FARO Releases FARO Edge ScanArm HD with Fast Scanning Speed and High-Definition Data Clarity

The Edge ScanArm HD delivers rapid point cloud collection with extreme resolution and high accuracy – all in a compact, lightweight and easy-to-use system. The new functionalities enable users to seamlessly scan across diverse surface materials regardless of contrast, reflectivity or part complexity and without any special coatings or target placement.

The Edge ScanArm HD will be available for live product demonstrations at the TCT Show Birmingham from 30th September until 2nd October 2014, stand B24, Hall 3A.

“The Laser Line Probe HD was developed to set a new standard in 3D laser scanning technology. We are strongly focused on the application needs of our customers, and we are confident that we will exceed their expectations,” stated Kathleen J. Hall, Senior Vice President and Managing Director, Americas. “The Edge ScanArm HD delivers high-definition data with superior speed and surface coverage at an affordable price, enabling our customers to reduce on-site measurement times, to scan very challenging materials, and to meaningfully improve their products and processes.”

The extra wide scan stripe and fast frame rate boosts productivity by increasing coverage and reducing scanning time. Intricate components can be captured in fine detail as a result of the 2,000 actual points per scanline and the new blue laser featuring noise reduction technology. Users can dramatically reduce required training time with the new crosshair feature and existing LED Rangefinder functionality, which provides real-time scanning feedback.

The FARO Edge ScanArm HD is the ideal tool for product development, inspection, and quality control and offers capabilities such as point cloud comparison with CAD, rapid prototyping, reverse engineering, and 3D modelling.

In combination with the all-in-one metrology software CAM2 Measure 10, FARO provides its customers with a unique solution for both contact and non-contact measurement perfectly suited for metrology challenges for a wide range of applications.