New ground-breaking XRF coating thickness analyzer that effectively ‘sets up’ itself.
Hitachi High-Tech transforms plating and coatings analysis with the new FT230
Oxford, February 22, 2022 – Hitachi High-Tech Analytical Science has expanded is plating and coatings analysis range with the launch of the revolutionary FT230. Adding to the existing FT and X-Strata series analyzers, the FT230 is designed to significantly simplify and accelerate testing of components and assemblies to help electronics and component-level manufacturers, general metal finishers and plating-on-plastic facilities achieve 100% inspection and meet tightening specifications.
Let the XRF make decisions for you
Every aspect of the FT230 was designed to reduce the amount of time it takes to complete an XRF measurement. Currently operators spend significantly more time preparing a measurement and manipulating the results than the XRF spends analyzing the part. The user experience (UX) of the FT230 is significantly improved by an intelligent part recognition feature called “Find my part” and a smart pattern recognition feature called “Find my pattern” that automatically select the features that need to be measured, the analytical routines and reporting rules so the operator spends less time using the XRF and more time working the results. The on-board, user-built library is easily expanded to handle new parts and new routines as your work changes.
Smart, simple interface
The FT230 is the first product running Hitachi’s all new FT Connect software, carrying the best aspects of its established SmartLink and X-ray Station software and adding new functionality ready to improve usability. FT Connect completely inverts the traditional interface. Whereas with traditional software, most of the screen is occupied by controls – many of which are used infrequently, if at all, FT Connect focuses the interface on the most important aspects of the XRF. The real estate is dominated by the largest sample view in the industry and clear results presentation, making it easier to position parts for analysis and see the results.