Optical wafer testing for μLEDs with LumiTop 4000

Efficient, simultaneous testing of thousands of μLEDs on a wafer with a 2D camera system from the LumiTop series

Instrument Systems offers a unique camera-based measurement solution for μLED wafer testing that generates 2-dimensional, pixel-resolved optical analyses within given cycle times. The LumiTop 4000 has a resolution of 12 MP and can detect the smallest of defects and inhomogeneities on the wafer. Thanks to a 100 mm macro lens, the camera enables fast parallel inline analysis of all μLEDs on a wafer at a single test station.

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81677 Munich, Germany

Instrument Systems GmbH

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