Live Webinar July 2nd, 2020
X-ray diffraction (XRD) is the only laboratory technique that reveals structural information, such as chemical composition, crystal structure, crystallite size, strain, preferred orientation and layer thickness. Materials researchers therefore use XRD to analyze a wide range of materials, from powder X-ray diffraction (XRPD) to solids, thin films and nanomaterials. Applications span from battery to catalysts, to clinker, colour pigments, layer coatings and more.
In our earlier series of XRD data analysis webinars, we covered the fundamentals to the physics behind the technique, how to prepare good samples and how to improve your overall data quality. In this webinar, our senior application specialist, Dr Daniel Lee, who is based in Seoul, provides a live demonstration of how to perform phase quantification. He will demonstrate with several data sets on Malvern Panalytical’s new version of HighScore Plus. Stay tuned to our webinar series for more of such XRD analytical tutorials.
You can register for free to all our webinars and you will automatically receive the On-Demand version