MTI Proforma 300i provides precise measurements throughout the wafer manufacturing process.

Silicon, Gallium-Arsenide, Indium-Phosphide wafers and mounted to sapphire or tape metrology

The Proforma 300i portable non-contact measurement system is completely menu-driven. The on-board intelligence provides fast, accurate, repeatable measurements for all types of wafer materials. Maximum measurement range or maximum probe/wafer stand-off distance can also be adjusted to meet your specific requirements.

- Measures different materials, such as Si, Ge, InP, and GaAs*, without recalibration

- No need to electrically ground the wafer

- Easy to Set up and Operate - making it ideal for Statistical Process Control (SPC)

- Provides high performance at low cost

- Can be customized for maximum sensing range or maximum stand-off from target