Advanced microscopy, simplified

Olympus’ modular BX3M upright microscope series and OLYMPUS Stream 2.1 micro-imaging software together seamlessly adapt to the needs of the user and enhance a variety of materials science and industrial applications

Flexible and user-friendly industrial inspection

The new modular BX3M series of upright microscopes can be easily customised to suit any need – from a cost-effective workhorse to a high-end research system. A user-friendly design includes advanced illumination modes for in-depth and efficient analysis, and is ideal for use alongside the new Olympus Stream 2.1 micro-imaging software.

Providing the best illumination for your sample

In addition to a vast selection of traditional illumination modes, the BX3M includes innovative imaging techniques and is especially ideal for failure analysis of complex samples. To enable faster topographic and defect analysis, directional darkfield is made possible through segmented LED illumination, which provides flexible illumination from different angles. For samples with varying structures such as a PCB, Olympus MIX illumination delivers unrivalled flexibility, as directional darkfield can be combined not only with brightfield, but also with polarisation and fluorescence imaging. This enables the acquisition of colour, contrast and topographic information in one comprehensive image, making the invisible visible and benefiting a host of applications, from the analysis of composite materials to flaw inspection of semiconductors.

Relax with guaranteed reproducibility

Reproducible results are guaranteed every time with the new Olympus Stream 2.1 software, which includes a "Restore Device Setting" function, allowing the same acquisition settings to be replicated quickly and efficiently. Alongside automatic calibration capabilities, this enables fast completion of quality assurance and quality control tasks requiring operational standards, for example in the automotive and aerospace sectors. Cutting-edge new features also include instant MIA for high-resolution visualisation of large samples exceeding the field of view - where a single large image is automatically generated.

For more information, please visit www.olympus-ims.com/en/microscope/bx/pus-ims.com