Ultrasonic Probes

Normal probe
Replaceable membrane normal probe
Replaceable delay line normal probe
Surface wave probe
Angle probe (transverse wave/longitudinal wave)
Angle probe with replaceable wedge
TR angle probe
TR normal probe
Thickness gauge probe (single crystal/twin crystal/high temperature)
Immersion probe
Variable-angle probe
Spot-weld probe
TOFD probe
Phased array probe

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Details

SIUI(Shantou Institute of Ultrasonic Instruments C

Keywords

Flaw detectors

Thickness gauges

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The SUPOR ultrasonic flaw detector represents SIUI’s continuous pursuit and innovation in ultrasound phased array (PA) and Time Of Flight Diffraction (TOFD) technologies, which incorporate many latest technologies such as ultrasound flaw detection, computer, electronics, mold tooling and craftwork, with which a perfect combination is achieved on the system.

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