New Kepler Test Socket

High performance scrub contact technology for Peripheral IC.

The Kepler contact technology combines the scrub motion of a cantilever contact with the versatility and modularity of a spring probe. The design includes horizontal movement during the downward stroke of the device to remove surface oxides, provide stable and reliable contact, and cause no damage to the PCB.

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Suzhou, Jiangsu, China

Smiths Interconnect

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Test sockets

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