Webinar Nov. 15th 11 AM EST (8 AM PST / 5:00 PM CET

Challenges for Test Sockets Running at 224 Gbps Data Rates

In this webinar we will discuss the challenges in designing and manufacturing an electro-mechanical interface for testing a Integrated Circuit running at 224 Gbps data rates. We will discuss the roadblocks in working in a fully simulated environment and our products that are capable of meeting next generation Integrated Circuit requirements. Overall, deploying an optimized hardware infrastructure that combines high-performance computing systems, specialized AI accelerators, efficient interconnects, storage solutions, and software frameworks is essential to realize the full potential of next-generation AI chips.

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Kansas City, MO, USA

Smiths Interconnect

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