#Trade Shows & Events
PRECISE Instrument presented the power device static parameter test solution at the China Optics Valley Jiufengshan Forum
Wang Cheng, deputy general manager of the company, delivered a speech.
The rapid rise of new semiconductor materials represented by compound semiconductors will have a crucial impact on the reshaping of the international semiconductor industry structure in the next 10 years. In order to further focus on the latest developments in compound semiconductor technologies and applications such as international semiconductor optoelectronics, semiconductor lasers, and power semiconductor devices, and promote the all-round and full-chain development of the compound semiconductor industry. From April 19th to 21st, the first China Optics Valley Jiufengshan Forum and Compound Semiconductor Industry Development Conference was held in Wuhan. With the support of the Hubei Provincial and Wuhan Municipal Governments, the forum is co-hosted by the Management Committee of Wuhan East Lake New Technology Development Zone, the Third Generation Semiconductor Industry Technology Innovation Strategic Alliance (CASA), Jiufengshan Laboratory, and Optics Valley Integrated Circuit Innovation Platform Alliance.
The theme of this forum is "climbing peaks, gathering wisdom, and inspiring the future". It will last for three days. Through the opening meeting, parallel forums on 5 major themes, and over 70+ session theme report sharing, 500+ business representatives are invited to discuss compound semiconductors. New trends in industrial development, new opportunities in the industry, and cutting-edge new technologies.
During the period, as a leading provider of optical communication and semiconductor testing equipment in China, Wuhan PRECISE brought pulse source meters for power device testing, 1000A high-current pulse power supplies (multiple units connected in parallel to 6000A), 3.5kV high-voltage source test units (expandable to 10KV), and the 100ns Lidar VCSEL wafer test machine appeared at the conference. Wang Cheng, deputy general manager of the company, was invited to share the theme of "Exploring the Influencing Factors of Static Parameter Test of Power Devices".
