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PRECISE Instrument - a new generation of semiconductor high-speed device I-V test solution

Endless research

With the rapid development and innovative application of new III-V semiconductor materials, how to easily achieve ultra-fast measurement of the characteristics of gallium nitride (GaN), gallium arsenide (GaAs) and other compound semiconductors like DC measurement I-V source and measure operation? How can I prevent device self-heating by using narrow pulses and/or low duty cycle pulses instead of DC signals? How to meet the application requirements that require both ultra-fast voltage output and simultaneous high-sensitivity current measurement?

The answer given by the ns-level semiconductor high-speed device I-V test solution launched by PRECISE Instruments is: fully satisfied!

Plug-in card design + 1CH/plug-in card + up to 10 channels, PRECISE instrument new generation pulse constant voltage source CP5xx series

CP5

Details

  • Wuhan, Hubei, China
  • PRECISE