How to conduct aging test for high power laser?

PRECISE NEWS

From a structural point of view, high-power semiconductor lasers are mainly divided into two structures: single tube and bar. The single tube structure mostly adopts the design of wide bar and large optical cavity, and increases the gain area to achieve high power output and reduce cavity surface catastrophe. Damage; the bar structure is a parallel linear array of multiple single-tube lasers, multiple lasers work at the same time, and then high-power laser output is achieved through beam combining and other means. From the perspective of packaging types, there are two types of packaging for semiconductor lasers, one is protective shell packaging, and the other is chip packaging. Protective shell packaging mainly includes T-mount packaging and butterfly packaging, etc. Chip packaging mainly includes F-Mount type packaging, C-Mount type packaging, etc. Although high-power semiconductor lasers are widely used, due to the high light output power of a single chip, the heat generated per unit area is large. If heat dissipation technology is not done well, the life and reliability of semiconductor lasers will be directly affected.

Therefore, high-power semiconductor lasers need to be tested for life and reliability under extreme conditions such as high temperature and current before leaving the factory. But we usually face some problems in testing:

1. During the LlV test, the photoelectric parameters are greatly affected by heat

2. The test results under DC and wide pulse are inaccurate

3. High-power lasers have poor surge resistance

4. The fluctuation of the power supply affects the life of the laser

So how do we test it correctly?

High Power Diode Laser Aging Test System Solution

For kilowatt-level high-power semiconductor lasers, PRECISE has launched a high-power laser aging test system solution with excellent cost performance. The equipment can be expanded to a 4-layer structure, and each layer is designed with several channels. Each channel supports the serial aging of 1-16 laser chips.

LDI series high power laser aging test system

The system includes high temperature environment control device, DC or pulse drive power supply, light receiving device, optical fiber, spectrometer (optional), circulating water cooling system, custom fixture, temperature collector and host computer, etc. Among them, the power supply is newly developed and independently designed by PRECISE HCPL series high power laser test power supply. 60A CW mode, 600A QCW mode