Posted on 9/7/2015
The SUPOR ultrasonic flaw detector represents SIUI’s continuous pursuit and innovation in ultrasound phased array (PA) and Time Of Flight Diffraction (TOFD) technologies, which incorporate many latest technologies such as ultrasound flaw detection, computer, electronics, mold tooling and craftwork, with which a perfect combination is achieved on the system.
Feature:
1. Grouping Scanning: It can be divided into up to six groups for one PAUT
probe for different inspections.
2. Support two PAUT probes working simultaneously with grouping function.
3. Modular design: Phased array module (16/32 channels), Phased array +
TOFD module, Multi-channel TOFD module or conventional UT module…
4. Simultaneous Inspection of PA & TOF...