Accurate Sapphire Wafer Measurement Problem Solved!

Traditional optical thickness measurements works only on certain surface finishes, while MTI Capacitance, together with our highly calibrated probes can measure the thickness of As-Cut,ground, lapped and polished wafers.

MTI Instruments' non-contact capacitance probes and New Digital Accumeasure amplifier are ideal for measuring sapphire wafer thickness due to high accuracy and immunity to optical effects.

Click to view how we and soon you can also measure this hard to measure dielectric material.

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