#Product Trends
MEASURING NON-CONDUCTIVE MATERIAL USING CAPACITANCE TECHNOLOGY
Users simply have to perform a quick (less than a minute) calibration with a sample of the material that has known thickness.
MTI capacitance sensors measure the thickness of insulating materials such as sapphire, glass, many plastics and even semi- insulating semiconductors material such as GaAs and silicon nitride with thickness <10mm and uniform dielectric constant.
Our new capacitance amplifier converts the gap capacitance directly to a digital target thickness. This direct conversion approach eliminates errors that traditional analog amplifiers have due to analog filtering, linearization, range extension and the summing of channels to obtain thickness or step measurements.
MTI provides a complete non-conductive material measuring system. Our complete package include a capacitance amplifier (up to 4 channels), MTI special dielectric probes, a dieletric fixture and a smart software package with built-in computing capability that takes all the guess work out of what used to be a complex measurement.
