#Industry News
Characterizing 3D surface topography fast, accurately and without contact
Why to measure optically with TopMap white-light intereferometers
When determining the topography of functional surfaces, white-light interferometers like the TopMap systems by Polytec drastically reduce measurement time compared to tactile systems, which capture only one line at a time. And with structured surfaces, you achieve a high reproducibility and repeatability. Its non-contact and thus non-destructive measurement method will be your key advantage when measuring on soft or sensitive surfaces, samples with complex geometries or workpieces with varying surface characteristics.
Learn more about the benefits of optical surface characterization, of areal scanning white-light interferometry and differences between macro-scale and micro-scale inspections of form parameters and structural details.
