#Product Trends
Optical measument of form deviation and roughness
Why non-contact coherence scanning interferometry (CSI) captures more details
Which measuring method is suitable for characterizing surface roughness? What is the easiest way to determine roughness together with form parameters? And what advantages and disadvantages are to be considered of the different approaches in every day quality control? The TopMap optical profilers from Polytec allow both the large area determination of form deviation with a nanometer-resolution and a large field-of-view plus the examination of surface roughness. While whitelight interferometry allows fast and efficient, areal surface inspection with over 2million measurement points captured within just seconds, an additional chromatic confocal sensor can determine simple roughness profile lines. Characterize entire workpiece surfaces, calculate volume and determine peaks and valleys reliably. Roughness, texture and form - we measure it!
