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Double-layer High and Low Temperature Test Chamber

Complies with GB/T5170.2-2008 , GB/2423.1-2008 (IEC60068-2-1:2007), GB/2423.2-2008 (IEC60068-2-2:2007) test standards.

Double-layer High and Low Temperature Test Chamber

This test chamber is mainly used for various reliability tests of power battery cells, cells, battery packs, battery modules and other related products as well as new materials and components under low temperature, high temperature or harsh environments. Placing the battery sample in the harsh environment of the test chamber can quickly find the direction of the problem, which is beneficial to improving quality and efficiency! Complies with GB/T5170.2-2008 , GB/2423.1-2008 (IEC60068-2-1:2007), GB/2423.2-2008 (IEC60068-2-2:2007) test standards.

Details

  • Changpingzhen, Dongguan, Guangdong Province, China, 523560
  • Sanwood Technology