MIL-STD-202 Sanwood Technology Two-zones Thermal Shock Test Chamber： Safeguarding the Reliability of Semiconductor Devices

Sanmu Technology's two-slot thermal shock test chamber can quickly simulate -65℃~150℃ temperature shock according to MIL-STD-202 standard, providing a reliable guarantee for semiconductor device reliability verification.

With the rapid development of the semiconductor industry, the reliability of chips and electronic components has become a key factor in determining the success or failure of products. Sanwood Technology's Two-zones Thermal Shock Test Chamber, developed specifically for the semiconductor field, strictly follows international testing standards such as MIL-STD-202, and provides a comprehensive reliability verification solution for wafers, packaged devices, power modules, etc. by accurately simulating an extreme temperature rapid change environment.

MIL-STD-202 is the Military Standard Test Methods for Electronic and Electrical Component Parts issued by the U.S. Department of Defense. Its temperature shock test (Method 107) has authoritative guidance for the environmental adaptability verification of semiconductor devices.

Parameters of Sanwood Technology's Two-zones Thermal Shock Test Chamber
Sanwood Technology's Two-zones Thermal Shock Test Chamber can be customized according to the customer's parameter requirements. The following are the basic technical parameters of Two-zones Thermal Shock Test Chamber:
Temperature shock range: -65℃～+150℃
Temperature shock recovery time: ≤5min, no-load
Temperature fluctuation: ≤±0.5℃, tested at constant temperature
Temperature uniformity: ≤2.0℃, tested at constant temperature
Temperature deviation: ≤±2℃, tested at constant temperature
Basket conversion time: completed within 10 seconds
Temperature shock measurement point: test area air outlet
Sanwood Technology's Two-zones Thermal Shock Test Chamber strictly follows international standards such as MIL-STD-202 to ensure the accuracy of test results.

Features of Sanwood Technology's Two-zones Thermal Shock Test Chamber
1. Short temperature shock recovery time.
2. Excellent temperature uniformity: Average airflow in the test area can produce excellent temperature distribution.
3. The volume, temperature and appearance of the chamber can be customized as needed.
4. The test chamber can be remotely controlled and monitored via mobile phones, tablets and PCs.
5. Multi-language operating system, which can be switched as needed.
The hot and cold two-chamber structure is adopted, and the test sample is quickly transferred to the test area using a basket to achieve the purpose of hot and cold shock testing and ensure the authenticity and effectiveness of the test.

In the pursuit of excellence and innovation, Sanwood Technology always takes customer needs as the core and is committed to providing professional and efficient environmental testing equipment to global customers. Its Two-zones Thermal Shock Test Chamber that complies with MIL-STD-202 has been successfully used in many well-known semiconductor companies at home and abroad, helping customers improve product reliability. In addition to Two-zones Thermal Shock Test Chamber, Sanwood Technology also provides Temperature Humidity Test Chamber, Rapid Temperature Change Test Chamber, Comprehensive Test Chamber and other test chamber, supporting personalized customization services.

If you need professional testing solutions, please contact Sanwood Technology, and we will tailor professional services for you.