Mitigating production risks with robust quality control

The main difference between SEM and TEM is that SEM creates an image by detecting reflected or knocked-off electrons, while TEM uses transmitted electrons (electrons that are passing through the sample) to create an image. As a result, TEM offers valuable information on the inner structure of the sample, such as crystal structure, morphology and stress state information,...

Material characterization is key to performance and safety in many industry sectors, yet conventional methods are often lacking. Thermo Scientific’s Apreo ChemiSEM system offers a complete and effective solution by integrating advanced imaging with AI-driven analysis, significantly improving the speed and accuracy of material evaluation. Applied in a thin layer to the s...

Scanning electron microscopes (SEMs) use an electron beam to image samples with a resolution down to the nanometer scale. The electrons are emitted from a filament and collimated into a beam in the electron source. The beam is then focused on the sample surface by a set of lenses in the electron column. How does an electron lens work? And which kind of lenses exist? How ...