#Industry News
Principles of Scanning Electron Microscopy
Scanning electron microscopy principles and instrumentation explained, including electron signals, the electron beam, and the electron column.
Scanning electron microscopes (SEMs) use an electron beam to image samples with a resolution down to the nanometer scale. The electrons are emitted from a filament and collimated into a beam in the electron source. The beam is then focused on the sample surface by a set of lenses in the electron column. How does an electron lens work? And which kind of lenses exist? How are lenses combined to form an electron column? In this article, we will answer these questions and give a general insight into the working principle of an electron column:
