Posted on 1/5/2017
Silicon, Gallium-Arsenide, Indium-Phosphide wafers and mounted to sapphire or tape metrology
The Proforma 300i portable non-contact measurement system is completely menu-driven. The on-board intelligence provides fast, accurate, repeatable measurements for all types of wafer materials. Maximum measurement range or maximum probe/wafer stand-off distance can also be adjusted to meet your specific requirements.
- Measures different materials, such as Si, Ge...
